PHOENIX CONTACT测厚仪Surfix S

PHOENIX CONTACT测厚仪Surfix S

Surfix S统计型涂层测厚仪为德国PHYNIX公司制造，可换8种碳化钨超耐磨测头测铁基和有色金属基上镀层和涂层。同屏显示统计数据.可存储前200测值,分辨率0.1μm。适于钢铁基体和有色金属基体上的涂镀层。耐表面温度 60℃。

Surfix S 可换探头统计型测厚仪的特点：

1.可换8种碳化钨超耐磨测头测铁基和有色金属基上镀层和涂层

2.同屏显示统计数据.可存储前200测值,分辨率0.1μm

3.根据所选探头:精度可达±0.7μm+1%,读数或范围可达10mm

4.探头需另选购

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